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Origin of electrically active and inactive defects associated with F impurity in SiO2
Origin of electrically active and inactive defects associated with F impurity in SiO2
- 제목
- Origin of electrically active and inactive defects associated with F impurity in SiO2
- 제목 (타언어)
- Origin of electrically active and inactive defects associated with F impurity in SiO2
- 저자
- 이은철
- 발행일
- 2008-10-24
- 학회명
- 2008년 추계 한국물리학회
- 개최지
- 김대중컨벤션센터 (광주)
- 개최국가
- 대한민국
- 학회 개최일
- 2008-10-23 ~ 2008-10-24