Optimization of transparent amorphous oxide-metal-amorphous oxide multilayer with high figure of merit for high transmittance and low resistivity

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초록

Highly transparent amorphous oxide-metal-amorphous oxide (OMO) multilayers were fabricated at room temperature using amorphous semiconducting Si–Zn–Sn–O (SZTO) metal oxide and metallic silver. Amorphous SZTO (a-SZTO) showed high refractive index of 2.04 which is comparable to crystalline ITO, and wide optical bandgap (Eg) of 3.26 eV, allowing transmitting of wavelength above 380 nm. SZTO based OMO showed low resistivity at the level of 10−5 Ω cm by inserting an Ag layer. After optimizing the optical and electrical properties by changing Ag and SZTO sublayer thickness, a transparent conductive electrode with high average transmittance of 96.5% in visible region and low resistivity of 7.158 × 10−5 Ω cm was fabricated at room temperature. The results show that SZTO is a promising sublayer for high performance transparent conducting oxides applications. © 2021

키워드

Amorphous oxideDrude scattering modelOMO multilayerOptical propertiesTransparent conducting oxidesMetalsMultilayersRefractive indexSemiconducting siliconTransparent conducting oxidesTransparent electrodesAmorphous oxidesFigure of meritsHigh refractive indexHigh transmittanceLow resistivityMetallic silverOptical and electrical propertiesTransparent conductive electrodesAmorphous silicon
제목
Optimization of transparent amorphous oxide-metal-amorphous oxide multilayer with high figure of merit for high transmittance and low resistivity
저자
Lee, S.Y.
DOI
10.1016/j.optmat.2021.110820
발행일
2021-02
유형
Article
저널명
Optical Materials
112