Fine-Tuned V th for Logic Reconfigurability in Dual-Gate Zinc Oxynitride Transistors

  • Shin, Heebeen; 
  • Han, Youngmin; 
  • Kim, Minseo; 
  • Park, Jae Yeon; 
  • Shin, Wonjun; 
  • ... Kim, Young-Joon; 
  • 외 3명
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초록

Dual-gate transistors enable tunable electrical behavior by introducing a second gate electrode, offering enhanced control over channel formation and threshold voltage (V th). Here, we report a dual-gate-controlled ZnON thin-film transistor (DGC-TFT) capable of finely modulating V th (Delta V = 0.34 to 0.54 V) through independent top and bottom gate inputs. By characterizing the transfer and output curves under various bias combinations, we reveal systematic V th shifts and dual-channel switching behavior arising from asymmetric gate dielectrics, organic parylene (top) and SiO2 (bottom). Finite-element TCAD simulations provide insights into the potential profiles, carrier distributions, and gate coupling mechanisms governing this behavior. Through this precise gate control, we demonstrate a dynamically tunable complementary inverter and implement five distinct logic functions (inverter, AND, OR, NAND, and NOR) using a single DGC-TFT device. These results highlight the promise of dual-gate architectures for compact, reconfigurable logic systems and adaptive circuit design.

키워드

dual-gate transistor; metal oxide; zinc oxynitride; finite-element simulation; logic gate circuit
제목
Fine-Tuned V th for Logic Reconfigurability in Dual-Gate Zinc Oxynitride Transistors
저자
Shin, Heebeen; Han, Youngmin; Kim, Minseo; Park, Jae Yeon; Shin, Wonjun; Kim, Young-Joon; Lee, Han-Koo; Kim, Chang-Hyun; Yoo, Hocheon
DOI
10.1021/acsaelm.5c02047
발행일
2025-12
유형
Article; Early Access
저널명
ACS APPLIED ELECTRONIC MATERIALS
권
7
호
23
페이지
10805 ~ 10814