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Photogating Effect-Driven Photodetectors and Their Emerging Applications
- Shin, Jihyun;
- Yoo, Hocheon
WEB OF SCIENCE
60SCOPUS
64초록
Rather than generating a photocurrent through photo-excited carriers by the photoelectric effect, the photogating effect enables us to detect sub-bandgap rays. The photogating effect is caused by trapped photo-induced charges that modulate the potential energy of the semiconductor/dielectric interface, where these trapped charges contribute an additional electrical gating-field, resulting in a shift in the threshold voltage. This approach clearly separates the drain current in dark versus bright exposures. In this review, we discuss the photogating effect-driven photodetectors with respect to emerging optoelectrical materials, device structures, and mechanisms. Representative examples that reported the photogating effect-based sub-bandgap photodetection are revisited. Furthermore, emerging applications using these photogating effects are highlighted. The potential and challenging aspects of next-generation photodetector devices are presented with an emphasis on the photogating effect.
키워드
- 제목
- Photogating Effect-Driven Photodetectors and Their Emerging Applications
- 저자
- Shin, Jihyun; Yoo, Hocheon
- 발행일
- 2023-03
- 유형
- Review
- 저널명
- NANOMATERIALS
- 권
- 13
- 호
- 5
- 언어
- ENG
- 출판사
- MDPI
- 발행국가
- 스위스
- ISSN
- E 2079-4991
P 2079-4991