Photogating Effect-Driven Photodetectors and Their Emerging Applications

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초록

Rather than generating a photocurrent through photo-excited carriers by the photoelectric effect, the photogating effect enables us to detect sub-bandgap rays. The photogating effect is caused by trapped photo-induced charges that modulate the potential energy of the semiconductor/dielectric interface, where these trapped charges contribute an additional electrical gating-field, resulting in a shift in the threshold voltage. This approach clearly separates the drain current in dark versus bright exposures. In this review, we discuss the photogating effect-driven photodetectors with respect to emerging optoelectrical materials, device structures, and mechanisms. Representative examples that reported the photogating effect-based sub-bandgap photodetection are revisited. Furthermore, emerging applications using these photogating effects are highlighted. The potential and challenging aspects of next-generation photodetector devices are presented with an emphasis on the photogating effect.

키워드

phototransistors; heterostructure; charge trapping; neuromorphic devices; photogating; PHOTOCURRENT GENERATION; X-RAY; PHOTOTRANSISTOR; PERFORMANCE; TRANSISTOR; ARRAY; HETEROSTRUCTURE; DEPOSITION; DETECTORS; CRYSTALS
제목
Photogating Effect-Driven Photodetectors and Their Emerging Applications
저자
Shin, Jihyun; Yoo, Hocheon
DOI
10.3390/nano13050882
발행일
2023-03
유형
Review
저널명
NANOMATERIALS
권
13
호
5