Self-Consistency-Based Fake Media Detection Using Multi-Perspective LLM Reasoning

  • Shahbazi, Zeinab
  • Behnamian, Sara
  • Shahbazi, Zahra
  • Jafari, Sadiqa
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초록

The rapid proliferation of synthetic and misleading media has intensified the need for robust fake media detection systems. While large language models (LLMs) have recently been employed as classifiers for misinformation detection, most existing approaches treat them as black-box predictors, overlooking their internal reasoning dynamics. In this paper, we propose a novel framework for fake media detection based on self-consistency divergence across multi-perspective LLM reasoning. Instead of generating a single verdict, the proposed method prompts an LLM to analyze a given media item from multiple independent reasoning perspectives, including factual consistency, logical coherence, emotional manipulation, and source credibility. By sampling multiple reasoning chains under controlled stochasticity, semantic divergence and logical instability across the generated explanations are quantified. We hypothesize, and empirically show, that fake media induces significantly greater reasoning variance than genuine content because fabricated narratives often lack stable factual grounding. Experiments conducted on benchmark fake news datasets show that reasoning divergence serves as a strong discriminative signal, improving detection robustness and interpretability compared to standard single-pass LLM classifiers. The findings suggest that internal reasoning instability can function as an intrinsic reliability metric, opening a new direction for explainable and model-centric fake media detection.

키워드

fake media detectionlarge language modelsreasoning instabilitymisinformation detectionmulti-dimensional reasoningreasoning trajectory analysissemantic divergence
제목
Self-Consistency-Based Fake Media Detection Using Multi-Perspective LLM Reasoning
저자
Shahbazi, ZeinabBehnamian, SaraShahbazi, ZahraJafari, Sadiqa
DOI
10.3390/electronics15091822
발행일
2026-04
유형
Article
저널명
ELECTRONICS
15
9