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Optical and Electron Microscopy for Analysis of Nanomaterials
- Kim, Hyoyeon;
- Murata, M.M.;
- Chang, Hyejin;
- Lee, Sang Hun;
- Kim, Jaehi;
- ... Lee, Jong Hun;
- 외 2명
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11초록
Not only is fabrication important for research in materials science, but also materials characterization and analysis. Special microscopes capable of ultra-high magnification are more essential for observing and analyzing nanoparticles than for macro-size particles. Recently, electron microscopy (EM) and scanning probe microscopy (SPM) are commonly used for observing and analyzing nanoparticles. In this chapter, the basic principles of various techniques in optical and electron microscopy are described and classified. In particular, techniques such as transmission electron microscopy (TEM) and scanning electron microscopy (SEM) are explained. © 2021, Springer Nature Singapore Pte Ltd.
키워드
Atomic force microscopy (AFM); Electron microscopy (EM); Microscopy; Near-field scanning optical microscopy (NSOM); Scanning electron microscopy (SEM); Scanning probe microscopy (SPM); Scanning tunneling microscopy (STM); Transmission electron microscopy (TEM); nanomaterial; nanoparticle; atomic force microscopy; scanning electron microscopy; scanning probe microscopy; Microscopy, Atomic Force; Microscopy, Electron, Scanning; Microscopy, Scanning Probe; Nanoparticles; Nanostructures
- 제목
- Optical and Electron Microscopy for Analysis of Nanomaterials
- 저자
- Kim, Hyoyeon; Murata, M.M.; Chang, Hyejin; Lee, Sang Hun; Kim, Jaehi; Lee, Jong Hun; Rho, Won-Yeop; Jun, Bong-Hyun
- 발행일
- 2021-03
- 유형
- Book Chapter
- 권
- 1309
- 페이지
- 277 ~ 287
- 언어
- ENG
- 출판사
- SPRINGER INTERNATIONAL PUBLISHING AG
- 발행국가
- 스위스
- 분량
- 11 페이지
- ISSN
- E 2214-8019
P 0065-2598