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Evaluating the Reliability of BAM:EuMn Thermographic Phosphor Coated Surfaces for Temperature Measurement
- Kang, Seongmin;
- Lee, Kyungjun;
- Mori, Hideo;
- Jeong, Jae-Ho
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0초록
A thermographic phosphor is a phosphor that exhibits different luminescence responses depending on temperature, with demonstrated capabilities for surface temperature measurements from room temperature upto 1600 degrees C. This remarkable temperature range makes it a key technology for noninvasive surface temperature measurement in energy systems, such as thermoelectric generators (TEGs), combustion systems or engines. The durability of the coating is particularly crucial for accurate temperature measurement in energy systems where intense thermal and mechanical loads occur. In this study, the reliability of thermographic phosphor coatings was evaluated based on thermal degradation and mechanical coating failure, with experimental validations conducted upto 300 degrees C using BAM:EuMn phosphors and ZYP-BNSL ceramic binders. This study analyzed the thermal degradation trends of specimens under different conditions to find favorable specimen preparation conditions that eliminate uncertainties in the temperature measurement process, and quantitatively assessed the mechanical bonding and reliability of the coatings using a novel, self-developed rolling wear testing apparatus. Through systematic analysis of coating failure mechanisms, the research established the relationship between powder-to-binder ratio and failure modes, enabling the determination of optimal coating conditions. These findings are expected to enhance the reliability of thermographic phosphor-based temperature measurements in various high-temperature energy applications, contributing to improved thermal system design and performance evaluation.
키워드
- 제목
- Evaluating the Reliability of BAM:EuMn Thermographic Phosphor Coated Surfaces for Temperature Measurement
- 저자
- Kang, Seongmin; Lee, Kyungjun; Mori, Hideo; Jeong, Jae-Ho
- 발행일
- 2025-12
- 유형
- Article
- 권
- 2025
- 호
- 1